KLA-Tencor UV-1280SE
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KLA-TENCOR PROMETRIX UV-1280SE THIN FILM MEASUREMENT SYSTEM consisting of:
- Model: Prometrix UV-1280SE
- Fully Upgraded from a UV-1250SE+
- Max wafer capable: 200mm
- Measures Film Thickness, Refractive Index (RI) and Extinction Coefficient of Single and Multi-Layer Thin Film Stacks Simultaneously without Referencing
- Reflectivity Range of 220 nm to 800 nm
- Intel Pentium Computer
- Box Size Upgrade
- Wafer Plane Exhaust Kit Upgrade
- Operations Manuals Included
- Fully Refurbished to meet original KLA UV1280 Specifications.
- Available for full inspection and demonstration in our Class 100 Cleanroom!
OPTIONAL PATMAX UPGRADE IS AVAILABLE* including:
- COGNEX 8100
- Cohu Camera
- Pentium 850 MHz Computer
*Inquire for pricing
MEASUREMENT CAPABILITIES*:
Single Layer Thickness (t):
- Thermal Oxide: 0
1997
Excellent Condition Guaranteed.
Fully Reconditioned to Factory Specifications.
6 Month Warranty and Full Specification Guarantee.
30 Day Right of Return.
6-8 weeks
