Thin Film Measurement

Metrology Equipment

View Refurbish

View Refurbish

Thin Film Measurement

Thin Film Measurement

Browse our complete inventory below or click here to learn why you should choose ClassOne for high quality Thin Film Measurement equipment.

Image

Manufacturer

Model

Configuration

JMAR

Non-Contact Automatic 3-Axis Vision Measurement System, Laser Based (1438)

100mm-200mm wafer capable, Broadband UV optics, Dual beam spectrophotometry

150mm-200mm Wafers, Measures Film Thickness, 2 Open Cassette Stations

150mm-200mm Wafers, Measures Film Thickness, 2 Open Cassette Stations

150mm-200mm Wafers, Measures Film Thickness, Refractive Index and Extinction Coefficient

150mm-200mm Wafers, Measures Film Thickness, Refractive Index and Extinction Coefficient, Patmax Available

Nanometrics

Film Thickness Measurement System, 200mm capable, Wafer Mapping Capability

Nanometrics

200mm and 300mm wafer capable, Automatic thin film analysis via Spectroscopic Ellipsometry

SD-4000 Ellipsometer

8"/200mm wafer capable, automated ellipsometer, 3 lasers

GES-5 Ellipsometer

Spectroscopic ellipsometer, - 12" Vacuum Chuck, variable angle, 210nm to 900nm spectral range