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Surface Metrology
Browse our complete inventory below or
click here
to learn why you should choose ClassOne for high quality Surface Metrology equipment.
Image
Manufacturer
Model
Configuration
Accent
Bio-Rad Q5 Registration System
Accent Bio-Rad Q5 Registration Tool
More Info
Accent
Bio-Rad Q8 Registration Tool
Overlay Metrology System, Setup for 8"/200mm Wafers, Fully Robotic
More Info
KLA-Tencor
5200XP
8"/200mm Wafer Capable, Fully Automated Non-Contact Box-In-Box Measurement
More Info
KLA-Tencor
5200XP Overlay Registration System
8"/200mm Wafer Capable, Fully Automated Non-Contact Box-In-Box Measurement
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KLA-Tencor
CRS 2000 Optical Defect Review System
Optical Defect Review System
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KLA-Tencor
FLX-2320 Stress Measurement System
200mm Chuck, Temperature up to 500C, Data Analysis Capability
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KLA-Tencor
HRP-200 Profiler
Calibrated to OEM Specifications, up to 8"/200mm Wafer Capable, Automated Handler
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KLA-Tencor
HRP-220 Profiler
Calibrated to OEM Specifications, up to 8"/200mm Wafer Capable, Automated Handler
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KLA-Tencor
P-22 Profiler
Automated Surface Profilometer, Calibrated to OEM Specifications, 8"/200mm Wafers, Automated Handler
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KLA-Tencor
P-22 Profiler
Automated Surface Profilometer, Calibrated to OEM Specifications, 8"/200mm Wafers, Automated Handler
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KLA-Tencor
Prometrics RS55/tc Four Point Probe Resistivity Mapping System
Temp Compensation, 200mm, Manual Wafer Handling, Contour Mapping, 3-D Plots, Diameter Scans
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KLA-Tencor
Prometrix RS55/tca Four Point Probe
Temp Compensation, 200mm, Manual Wafer Handling, Contour Mapping, 3-D Plots, Diameter Scans
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KLA-Tencor
Prometrix RS75
Up to 200mm, Four Point Probe, 3-D Plots, Contour Mapping
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Mitutoyo
QV202 Vision Measurement System
Non-contact, 3-D vision measuring machine, 0.1um resolution
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MTS
Nano Indenter SA2
Characterize material surfaces down to the level of a few nanometers
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