Surface Metrology

Metrology Equipment

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Surface Metrology

Surface Metrology

Browse our complete inventory below or click here to learn why you should choose ClassOne for high quality Surface Metrology equipment.

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Manufacturer

Model

Configuration

Bio-Rad Q5 Registration System

Accent Bio-Rad Q5 Registration Tool

Bio-Rad Q8 Registration Tool

Overlay Metrology System, Setup for 8"/200mm Wafers, Fully Robotic

8"/200mm Wafer Capable, Fully Automated Non-Contact Box-In-Box Measurement

5200XP Overlay Registration System

8"/200mm Wafer Capable, Fully Automated Non-Contact Box-In-Box Measurement

CRS 2000 Optical Defect Review System

Optical Defect Review System

FLX-2320 Stress Measurement System

200mm Chuck, Temperature up to 500C, Data Analysis Capability

HRP-200 Profiler

Calibrated to OEM Specifications, up to 8"/200mm Wafer Capable, Automated Handler

HRP-220 Profiler

Calibrated to OEM Specifications, up to 8"/200mm Wafer Capable, Automated Handler

Automated Surface Profilometer, Calibrated to OEM Specifications, 8"/200mm Wafers, Automated Handler

Automated Surface Profilometer, Calibrated to OEM Specifications, 8"/200mm Wafers, Automated Handler

Prometrics RS55/tc Four Point Probe Resistivity Mapping System

Temp Compensation, 200mm, Manual Wafer Handling, Contour Mapping, 3-D Plots, Diameter Scans

Prometrix RS55/tca Four Point Probe

Temp Compensation, 200mm, Manual Wafer Handling, Contour Mapping, 3-D Plots, Diameter Scans

Up to 200mm, Four Point Probe, 3-D Plots, Contour Mapping

QV202 Vision Measurement System

Non-contact, 3-D vision measuring machine, 0.1um resolution

MTS

Nano Indenter SA2

Characterize material surfaces down to the level of a few nanometers