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Home ›  Metrology Equipment › Scanning Electron Microscopes

Scanning Electron Microscopes

	Manufacturer	Model	Configuration	Price
	Cambridge	Stereoscan S-360 SEM	2.5nm Resolution, 1x to 300,000x Magnification, up to 6""/150mm wafers	CALL
	Hitachi	S-4500 SEM	20x – 500KX Magnification, Cold Field Emission SEM, Type II Chamber, EDX, Backscatter, Turbo Pump	CALL
	Hitachi	S-4500 SEM	20x – 500KX magnification, Cold field emission SEM, Type II chamber	CALL
	Hitachi	S-4700 SEM System	Type II Load Lock Stage, 100mm Stage, 20x-500,000x magnification, Fully Refurbished to OEM Specifications	CALL
	Hitachi	S8840 SEM	Production CD-SEM, 200mm capable, refurbished by Hitachi trained technicians	CALL
	JEOL	JWS 7700 FE SEM	EDX, EDS Interface Kit and 5KV Option, up to 8""/200mm capable, Robotic Handling (M1148)	CALL