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Home ›  Metrology Equipment › Surface Metrology Equipment

Surface Metrology Equipment

	Manufacturer	Model	Configuration	Price
	Four Dimensions	CV Map 3092-A	Four Dimensions CV Map 3092A, Keithley 590 CV Analyzer	CALL
	JMAR	Mirage Non-Contact Automatic Measurement System	Non-Contact Automatic 3-Axis Vision Measurement System, Laser Based	CALL
	KLA-Tencor	Alpha Step 200 Profiler	Alpha Step 200 Surface Profiler	CALL
	KLA-Tencor	Alpha-Step 100 Profiler	Surface Profiler with Printer	CALL
	KLA-Tencor	Alpha-Step 200 Profiler	Alpha Step 200 Surface Profiler	CALL
	KLA-Tencor	Alpha-Step 500 Profiler	6""/150mm wafer capable, measurement Resolution to 1 Angstrom	CALL
	KLA-Tencor	Alpha-Step 500 Profilometer	6""/150mm wafer capable, measurement Resolution to 1 Angstrom	CALL
	KLA-Tencor	FLX-2320	Flexus Film Stress Measurement System, 3""-8"" wafer capable, data analysis capability	CALL
	KLA-Tencor	FLX-2320 Film Stress Measurement System	Flexus Film Stress Measurement System, 3""-6"" wafer capable, data analysis capability	CALL
	KLA-Tencor	FLX-2410 Film Stress Measurement System	Flexus Film Stress Measurement System, 3""-8"" wafer capable, data analysis capability	CALL
	KLA-Tencor	P-10 Surface Profiler	Calibrated to OEM specifications, up to 8""/200mm Wafer Capable	CALL
	KLA-Tencor	P-11 Long Scan Profiler	Calibrated to OEM specifications, up to 8""/200mm wafer capable	CALL
	KLA-Tencor	Prometrix RS35C	up to 8""/200mm wafers, Contour Maps, 3-D Maps, Diameter Scans, Die Maps	CALL
	KLA-Tencor	Prometrix RS55/tca	Temp Compensation, 200mm, Automated, Cassette to Cassette, Contour Mapping, 3-D Plots, Diameter Scans	CALL
	KLA-Tencor	Prometrix RS55/tcu	Temp Compensation, 200mm, Automated, Cassette to Cassette, Contour Mapping, 3-D Plots, Diameter Scans	CALL
	KLA-Tencor	Prometrix RS75/tca	Automated, Temperature Compensation, up to 200mm, 3-D Plots, Contour Mapping	CALL
	Mitutoyo	QV202 - PRO6F Die Tilt Measurement System	4 Color LED Coaxial and LED Ring Light, 0.1 µm .000004"" (0.0001 mm) Resolution	CALL
	Prometrix	VP10 Automated 4-Point Probe	Can handle 2""-8"" wafers, Measures doped films, metal films, and other conductive layers (1624)	$2,500.00
	UBM	UBC 14 Non-Contact Measuring System	Laser-based measuring system, range of 1 mm, accuracy of 10 nm	CALL
	Veeco	5000 AFM System	200mm chuck, Light Tight Enclosure, Isolation Table	CALL
	Veeco	Dektak 3 Profiler	Up to 5"" wafer capable, Measures step height, surface roughness, waviness and curvature	CALL
	View Engineering	Pinnacle 250 Optical CD Measurement System	250x150x100mm Measuring Range, 25kg Load Capacity, 0.1µm Stage Resolution	CALL