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Home ›  Metrology Equipment › Thin Film Measurement Equipment

Thin Film Measurement Equipment

	Manufacturer	Model	Configuration	Price
	KLA-Tencor	ASET F5x Thin Film Measurement System	Setup for 200mm and 300mm wafers, Single Wavelength Ellipsometer (SWE), D2 Lamp, Positive Pressure Kit Options	CALL
	KLA-Tencor	ASET F5x Thin Film Measurement System	KLA-Tencor ASET F5x Thin Film Measurement System	CALL
	KLA-Tencor	Prometrix UV-1280SE	Setup for 150mm and 200mm wafers, Measures film thickness, refractive index and extinction coefficient	CALL
	KLA-Tencor	UV-1050 Thin Film Measurement System	100mm-200mm wafer capable, Broadband UV optics, Dual beam spectrophotometry	CALL
	Magne-Tron	M-800A 4-Point Probe System	Used to measure resistivity of a thin film or diffusion layer on an insulating material	CALL
	Nanometrics	Nanospec 4150	Film Thickness Measurement System, 200mm capable, Autofocus, Wafer Mapping Capability	CALL
	Nanometrics	Nanospec 8300	Automatic thin film analysis via Spectroscopic Ellipsometry, 200mm and 300mm wafer capable	CALL
	Rudolph	MetaPULSE 200 Metrology System	Production metal and opaque thin film metrology system, 8""/200mm wafers	CALL
	Therma-Wave	Optiprobe 2600B	Film Thickness Measurement System, Set for 8""/200mm wafers	CALL
	Therma-Wave	Optiprobe Thin Film Measurement System	Therma-Wave Optiprobe Thin Film Measurement and Thermaprobe TP Systems	CALL