KLA / MicroSense UMA-C200-STR Thin Film Stress Measurement System
OEM Part #:
UMA-C200-STR
OEM Name:
KLA / MicroSense
ID #:
5076
Product Details:
KLA / MicroSense UMA-C200-STR Thin Film Stress Measurement System consisting of:
- Vintage: Approximately 2019 - Provides: - Wafer Thickness - Average wafer bow and warp, average wafer radius of curvature - Average wafer film stress - 2D Local Stress Map with Min and Max values - 3D Local Stress Map with Min and Max values - Local Line Stress Profiles with specified orientation, including Min and Max values. - Exportable data and maps - Used Minimally for R&D & Light Production - Inquire for More Information!
Condition:
Used
Condition:
Operational, installed in fab.
Being Sold in As-Is / Where-Is Condition.
Description:
KLA/ MicroSense UMA-C200-STR Thin Film Stress Measurement System.
Additional Questions:
Contact: sales@classoneequipment.com
