News from ClassOne

ClassOne Equipment Acquires Inventory of former SUSS Reman, Expands Legacy Mask Aligner Service and Support

ClassOne Equipment announced its acquisition of inventory of the former Remanufactured business of SUSS MicroTec SE, known in the semiconductor industry as SUSS Reman. The division is widely recognized for refurbishing and supporting legacy mask aligners, including the MJB3, Gen2 MA6 and MA8, MA150cc/MA150e, and MA200cc/MA200e systems.

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Beneq Selects 300mm Takano WM-10R Particle Inspection System from ClassOne Equipment

September 17, 2024 – ClassOne Equipment announced today that Beneq has selected the Takano WM-10R as its primary particle scanner. The Takano WM-10R offers highly repeatable particle inspection with maximum sensitivity to 48nm on 300mm wafers.

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Technical University of Denmark Unveils New System

June 20, 2023 – ClassOne Equipment announced the sale of its advanced new Takano WM-7SR particle measurement system to the DTU Nanolab at the Technical University of Denmark.

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Takano Particle Detection System Delivered to EUV Tech

June 5, 2023 – ClassOne Equipment announced the delivery of its advanced new Takano WM-10 particle measurement system to EUV Tech, a global leader in metrology equipment for cutting-edge EUV chip manufacturing.

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ClassOne Equipment Provides Neuralink New Equipment

April 24, 2023 – ClassOne Equipment has announced the sale of its advanced new Takano particle measurement system to Neuralink Corp., the California-based developer of leading-edge brain-computer interfaces.

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New Lot of Used Semiconductor Tools for Resale

November 2, 2022 – ClassOne Equipment has announced the release of a new lot of more than 80 highly-desirable production tools.

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Acquisition of Fab's Complete Chip Manufacturing Line

July 20, 2022 – ClassOne Equipment has announced its acquisition of a major fab’s complete line of production tools for resale.

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SEMICON West: ClassOne Equipment to Show New Particle Inspection System

July 6Atlanta, GA – July 6, 2022 – ClassOne Equipment will be showing the new high-performance Takano WM-7SR particle inspection system in its exhibit at SEMICON West in San Francisco next week – Booth 1460, South Hall. Designed specifically for ≤200mm unpatterned wafer inspection, this advanced tool now offers an even higher sensitivity option. This enables it to deliver class-leading 61nm particle sensitivity and COP defect detection. The new WM-7SR also features sensitivity mode switching, high dynamic range, and high throughput.

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New Takano Particle Inspection Systems Replace Outdated Tools

April 27, 2022 – ClassOne Equipment has just introduced two new high-performance Takano particle inspection systems for ≤200mm and ≤300mm unpatterned wafers. ClassOne was recently selected to be Takano’s exclusive inspection tool representative for North America, Europe, and Israel.

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Takano Selects ClassOne Equipment

April 5, 2022 – ClassOne Equipment, the industry’s leading provider of refurbished semiconductor equipment, will now also be representing a line of brand-new, high-performance bare wafer particle inspection systems from the Japanese manufacturer Takano.

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KLA-Tencor SP1 Systems Service and Support

ClassOne Equipment announced new service and maintenance solutions for KLA-Tencor Surfscan SP1 systems. ClassOne has added experienced technicians to its staff as well as...

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KLA-Tencor AIT Systems Service and Support

ClassOne Equipment provides service and maintenance solutions for an extensive range of KLA-Tencor AIT systems. We provide a full suite of services including; laser replacement, decommission, installation, etc...

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Used Wet Benches

Selection and quality come together in the catalog of available used wet benches from ClassOne Equipment – with tools from top=quality manufacturers such as Reynoldstech, Amerimade, Wafab, Universal Plastics, Ultra Fab, and more...

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Used Semiconductor Equipment

When top quality, affordable used semiconductor equipment is on your agenda, turn to ClassOne Equipment. We lead the used semiconductor equipment industry with our superior attention to detail and by providing...

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