Wafer Inspection

KLA-Tencor Prometrix RS-75 Four Point Probe System

Manufacturer
OEM Part #
Description
ID #4990
Condition

KLA-Tencor Candela CS920 Surface Analyzer

Manufacturer
OEM Part #
Description
ID #5100
Condition

KLA-Tencor 2139 Surface Inspection System

Manufacturer
OEM Part #
Description
ID #5099
Condition

Rudolph NSX-115 Advanced Wafer Inspection

Manufacturer
OEM Part #
Description
ID #4768
Condition

Rudolph / August NSX-105 Automated Wafer, Die & Bump Inspection

Manufacturer
OEM Part #
Description
ID #4767
Condition

Nikon Eclipse L200N Microscope

Manufacturer
OEM Part #
Description
ID #4959
Condition

Nikon Microscope w/ Irvine Optical Ultrastation

Manufacturer
OEM Part #
Description
ID #4774
Condition

Nikon Microscope w/ Irvine Optical Ultrastation

Manufacturer
OEM Part #
Description
ID #4770
Condition